Pike
Technical
Manual
V5.2.3
131
Description of the data path
Description
of
the
data
path
Defect pixel correction (Pike F-1100, F-1600 only)
ON
Semiconductor
sensors
for
Pike
F-1100,
F-1600
are
delivered
with
standard
class
2
sensors,
which
allow
certain
types
of
defect
pixels
according
to
the
following
ON
Semiconductor
definitions.
Defect pixel definitions for Pike F-1100
The
following
defect
pixel
definitions
are
according
data
sheet
for
ON
Semiconductor
KAI-11002.
Description
Definition
Class X
Class 0
Class 1
Class 2
Class 2
Monochrome
with microlens
only
Monochrome
with microlens
only
Color only
Monochrome
only
Major
dark
field
defect
pixel
Defect
239
mV
100
100
100
200
200
Major
bright
field
defect
pixel
Defect
15%
Minor
dark
field
defect
pixel
Defect
123
mV
1000
1000
1000
2000
2000
Cluster
defect
A
group
of
2
to
N
contiguous
major
defect
pixels,
but
no
more
than
W
adjacent
defects
horizontally.
0
1
N=10
W=3
20
N=10
W=3
20
N=10
W=3
20
N=12
W=5
Column
defect
A
group
of
more
than
10
contiguous
major
defect
pixels
along
a
single
column.
0
0
0
10
2
Table 50: Defect pixel definitions: Pike F-1100 (ON Semiconductor KAI-11002 sensors)
