OPERATING AND USER MANUAL Q-12 CoaXPress series
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Adimec
25
7.4.2 BuiltInTest
| RO | E |
BuiltInTest can give multiple error messages at the same time. The error values are then added
together. To decode which error has occurred start with the largest value that fits into the returned
BuiltInTest value and then subtract it. After subtracting again search for the largest number that fits into
the remaining value. Continue until after subtracting the value equals zero.
Example:
BuiltInTest 2084
2048 – Camera configuration corrupt
Remainder 0036
0032 – User defect pixel data corrupt
Remainder 0004
0004 – Factory settings corrupt
Value
Issue
Failure condition
When tested
1
1 & 2
FPGA not booted
At start-up
2
1 & 2
Flash not recognized
At start-up
4
1 & 2
Factory settings corrupt
When data is read from flash
8
1 & 2
User settings corrupt
When data is read from flash
16
1 & 2
Factory defect pixel data corrupt
When data is read from flash
32
1 & 2
User defect pixel data corrupt
When data is read from flash
64
1 & 2
Calibration corrupt
When data is read from flash
128
1 & 2
5V power supply error
At start-up
256
1 & 2
1.8V power supply error
At start-up
512
1 & 2
1.2V power supply error
At start-up
1024
1 & 2
1V Power supply error
At start-up
2048
1 & 2
Camera configuration corrupt (m/c,
Bayer phase)
At start-up
4096
1 & 2
Look-Up Table corrupt
When data is read from flash
8192
1 & 2
Device Names corrupt
At start-up
16384
1 & 2
Sensor data alignment failed
Continuous; actual status is updated on a
1 sec. interval
32768
2
Band table corrupt
When data is read from flash
65536
2
Sequence table corrupt
When data is read from flash
131072
2
LF FF Set table corrupt
When data is read from flash
