2-2
TI04L55B01-01EN
Analog Input Module Scan Intervals and Measurement Types
Type
Channels
Scan
interval
(fastest)
Scanner TC RTD DCV DI mA Resistance
Use
Universal (-U2)
10
100 ms
SSR
ü
ü
ü
ü
Universal
Low withstand
voltage relay (-L1)
10
500 ms
SSR
ü
ü
ü
Low price
Electromagnetic
relay (-T1)
10
1 s
Relay
ü
ü
ü
Noise
tolerance
DC current (mA)
input (-C1)
10
100 ms
SSR
ü
mA only
High withstand
voltage (-V1)
10
100 ms
SSR
ü
ü
ü
ü
High
withstand
voltage
High-speed
universal (-H0)
4
1 ms
ü
ü
ü
ü
High-speed
universal
4-wire RTD/
resistanse
6
100 ms
SSR
ü
ü
4-wire RTD
2.2
Flexible Support for Channel Additions and
Reductions
YOKOGAWA’s original block structure (patented)
l
Modules can be added one module at a time.
l
Unique structure in which modules are linked to a module base
l
Secure linking using a module base (slide lock mechanism; can also be fastened with screws)
l
Module insertion and removal from the front, easy maintenance
The GM can be set up in a single unit system or multi unit system.
Max. 100 Channel Measurement Standard (Single unit)
This system consists only of a main unit for data acquisition.
Содержание SMARTDAC+ GM
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