Tektronix TLA 720, Руководство по обслуживанию

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TLA 720 Benchtop Chassis and TLA 7XM Expansion Chassis Service Manual
2–67
TEST Subsystem
This section describes each command and query in the TEST subsystem. These
commands are used to execute internal self tests. The TEST subsystem controls
the parameters shown in Figure 2–11.
TEST
ALL? NUMBer
RESults
Figure 2–11: TEST subsystem hierarchy
Table 2–11 lists all of the internal self tests of the mainframe.
Table 2–11:
Mainframe self test
Test number Test name
Execution time
(seconds)
Power on test
Included in
TEST? Invoked by
TEST:NUMBer?
1000 Fan Speed Control 116 No Yes Yes
1010 ADC and DAC Control < 1 Yes Yes Yes
A description of each self test is listed below:
H
Fan Speed Control test. This test varies the fan speed control and verifies
that the fan speed changes accordingly.
H
ADC and DAC Control test. This test verifies the internal ADC and DAC
circuitry.