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ST2826 Operation manual
Ver1.0
◇
55
HD HS LS LD
Shielded ground
Cd
Test terminal
Cx
Ch Cl
Metal conductor
Figure 5-1 the disturb of the stray capacitance
HD HS LS LD
Shielded ground
Shielded
board
Test terminal
Cx
Metal conductor
Figure 5-2 the method of eliminating the disturb of the stray capacitance
When the DUT is High Impedance (e.g.: small capacitance), the disturbance of the stray
capacitance should not be neglected. In figure 5-1, when there is a conductor board below the
DUT, the test result will be error. But when a grounded conductor is placed between the HS
and the LS, Cd can be reduced to the smallest. At the same time, if the grounded conductor is
placed between the LD and Metal conductor, the effect of the Ch and the Cl will be
eliminated.
When the DUT is low impedance (e.g.: small inductance, big capacitance), the main
source
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