Appendix B
Specifications
114
Power Supply
Unit
C200HW-PD024
C200H-PA209R
C200HW-PA204R
C200HW-PA204S
C200HW-PA204
Noise immunity
1,500 Vp-p, pulse width: 100 ns to 1
µ
s, rise time: 1 ns pulse (by noise simulator)
Vibration
resistance
JIS C0040 conforming,10 to 57 Hz; 0.075 mm amplitude, 57 to 150 Hz (see note 3); acceleration:
9.8 m/s
2
, in X, Y, and Z directions, for 80 minutes each (sweep time 8 min x 10 sweeps = 80 min);
(When mounted on DIN track, 2 to 55 Hz, 2.94 m/s
2
, in X, Y, and Z directions, for 20 minutes each)
Shock resistance
JIS C0041 conforming, 147 m/s
2
in X, Y, and Z directions, 3 times each
Ambient
temperature
Operating: 0
°
to 55
°
C; storage: –20
°
to 75
°
C (without battery)
Humidity
10% to 90% (without condensation)
Atmosphere
Must be free of the following:
•
Corrosive gases
•
Abrupt temperature changes
•
Direct sunlight
•
Dust, salt, or metal filings
•
Water, oil, or chemicals
Grounding
Class 3 ground
Enclosure rating
Mounted in a panel
Weight
6 kg max.
Dimensions (CPU
Racks)
(See note 4.)
2-slot Rack:
198.5 x 130 x 118 (WxHxD)
3-slot Rack:
260 x 130 x 118 (WxHxD)
5-slot Rack:
330 x 130 x 118 (WxHxD)
8-slot Rack:
435 x 130 x 118 (WxHxD)
10-slot Rack:
505 x 130 x 118 (WxHxD)
Note: If the C200HW-PA209R is used, D will be 153 mm in the above dimensions.
Note 1. The output voltage of the 24-VDC output will vary with the current consumption of the load as shown in
the following table. Be sure to check the current consumption and allowable voltage ranges of the de-
vices connected before using these terminals. (The combined power consumption for 5 V, 26 V, and 24
V (24-VDC output on PA204S) must be 30 W or less.)
Load current on 24-VDC
output
Less than 0.3 A
0.3 A or higher
Accuracy of 24-VDC output
for lot No. 0197 or later
+17%
–11%
+10%
–11%
Accuracy of 24-VDC output
for lot No. 3187 or earlier
+10%
–20%
Lot numbers are as shown in the following diagram.
0 1 9 7
1997 (Rightmost digit of year)
September (Month: 1 to 9 = Jan to Sep, X/Y/Z = Oct/Nov/Dec
01 (Day: 01 to 31)
2. Internal components can be damaged if insulation resistance or dielectric strength tests are conducted
with the LG and GR terminals connected.
Содержание C200HE-CPU -Z Series
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