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NXP Semiconductors
UM11183
KITFS85SKTEVM evaluation board
UM11183
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User guide
Rev. 2.0 — 20 February 2019
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8.4.10 TestMode:Mirrors_Main and TestMode:Mirrors_Failsafe
The TestModeMirrors_Main and TestModeMirrors_FailSafe tabs allow access to the OTP
main mirrors and fail-safe registers. These tabs are available in Test mode.
Figure 41. TestMode: Mirrors_Main