natus XLTEK EEG32U, Руководство пользователя и обслуживания

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User and Service Manual XLTEK EEG32U Amplifier
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IEC 61000-4-2:2008, ed 2.0 Electromagnetic Compatibility (EMC) Part 4-2: Testing
and Measurement Techniques - Electrostatic
Discharge Immunity Test
IEC 61000-4-3 ed 3.0 with
A1:2007+A2:2010 Electromagnetic Compatibility (EMC) Part 4-3: Testing
and Measurement Techniques - Radiated, Radio-
frequency, Electromagnetic Field Immunity Test
IEC 61000-4-4:2012, ed 3.0 Electromagnetic Compatibility (EMC) Part 4-4: Testing
and Measurement Techniques - Electrical Fast
Transient/Burst Immunity Test
IEC 61000-4-5:2014, ed 3.0 Electromagnetic Compatibility (EMC) Part 4-5: Testing
and Measurement Techniques - Surge Immunity Test
IEC 61000-4-6 ed 2.0 with A1:2004 +
A2:2006 Electromagnetic Compatibility (EMC) Part 4-6: Testing
and Measurement Techniques - Immunity to
Conducted Disturbances, Induced by Radio-frequency
Fields
IEC 61000-4-8:2009, ed 2.0 Electromagnetic Compatibility (EMC) Part 4-8: Testing
and Measurement Techniques - Power Frequency
Magnetic Field Immunity Test
IEC 61000-4-11:2004, ed 2.0 Electromagnetic Compatibility (EMC) Part 4-11:
Testing and Measurement Techniques - Voltage Dips,
Short Interruptions and Voltage Variations Immunity
Tests
IEC 61000-3-2:2014, ed 4.0 Electromagnetic Compatibility (EMC) Part 3-2: Limits -
Limits for Harmonic Current Emissions
IEC 61000-3-3:2013, ed 3.0 Electromagnetic Compatibility (EMC) Part 3-3: Limits -
Limitation of Voltage Changes, Voltage Fluctuations
and Flicker in Public Low-voltage Supply Systems
CISPR 11 ed 5.0 with A1:2010 Industrial, Scientific and Medical (ISM) Radio-
Frequency Equipment - Electromagnetic Disturbance
Characteristics - Limits and Methods of Measurement