- 38 -
LANGER
EMV-Technik
DE-01728 Bannewitz
[email protected]
www.langer-emv.de
E1
ES 05D E-field sources
Use
ES 05D couples an electric field to an
SMD resistor to test the sensitivity of
the associated line network and IC
inputs. Pull-up or pull-down resistors
usually pose a high risk and should
thus always be tested.
ES 05D couples an electric field to the
housing of an IC to test the IC's E-field
sensitivity. Depending on the
manufacturer, ICs may be very
sensitive to electric fields. The IC's
oscillator cells and PLL cells are usually
E-field sensitive.
ES 08D E-field sources
Use
ES 02 couples an electric field to a
conductor run to investigate whether
a malfunction occurs in the associated
IC.
ES 08D injects a disturbance current
into individual IC pins. Thanks to the
needle-shaped tip the desired pin can
be exactly selected to test whether
the IC pin can be affected by
capacitive disturbance current. The
individual IC pins can be compared
and evaluated.
(The exact immunity levels can be
determined with the
IC test system
:
www.langer-emv.de)
Please refer to Chapter 2.2 for tips on how to select the individual probes.
