LANGER EMV-Technik E 1, Руководство пользователя

Страница: 9 / 48

- 9 -
LANGER
EMV-Technik
DE-01728 Bannewitz
mail@langer-emv.de
www.langer-emv.de
E1
BS 04DB is a field source to localise weak points in the layout. It
generates a B-field line bundle in the millimetre range
(approx. 3 mm). The field beam emerging from the probe's face
can be used to scan the surface of circuit boards and resolve
magnetically sensitive weak points in small spaces of 3 mm in the
field of layout and packaging. The BS°04DB allows the localisation
of critical conductor run sections, components and component
connections.
BS 05D is a field source to localise weak points in the layout. The
magnetic field source generates a B-field line bundle with a
diameter of approx. 3 mm similar to the BS 04 DB. But the field
lines are at an angle of 90° to the probe shaft. The probe is thus
ideal to localise weak points between two printed circuit boards
or in hard-to-reach locations of modules between components,
for example. Before using the BS 05D field probe, the weak point
should be roughly narrowed down with the BS 02 or BS 04DB
probe.
BS 05DU is a field source that can be used to determine an
individual IC pin's/conductor's sensitivity. The magnetic field source
generates a circular magnetic field in the millimetre range. It can
also be used as a mini coupling clamp to couple disturbance current
into selected individual conductor runs, IC pins, SMD devices and
thin lines (ribbon cable).
A module often has several insensitive and only a few sensitive
signal connections (conductor runs, IC pins). The field source is
the ideal tool to quickly identify the sensitive ones and carry out
appropriate layout modifications.
2.2.2 Field sources for electric fields
The E1 contains five field sources which are able to generate electric fields. Thanks to the probe head's
various designs, two types of measurements can be performed:
a) Determination of an IC pin's/conductor's sensitivity
b) Localisation of weak points in the layout
The size of the coupling electrode in the probe head is the field sources' distinguishing feature.
ES 08D is a probe tip that can be used to determine an
individual IC pin's/conductor's sensitivity. A galvanic isolating
point with capacitive coupling of approx. 1 pF is contained in
the probe tip which is ideal for very small structures. The
pin/conductor run is contacted with the probe tip and its
sensitivity determined by changing the intensity on the
SGZ 21 ("Intensity" controller) in the test. The field source has
to be connected via two poles. One conductor is connected to
the probe tip via a coupling capacitance of 1 pF. The second
conductor is connected to a counter-electrode, preventing
disturbance current from flowing through the device under
test unintentionally and thus affecting other areas.
Connection: two-pole