M-2000® Hardware Manual
©2023 J.A. Woollam Co.
131
size
.” This may be performed as many times as needed; it will not save
until the window is closed.
Figure 8-12. Set Beam Position.
6.
Close the window when finished.
Lookdown Camera LED Spot vs. Measurement Beam Location
If the sample under measurement is a small area, it is critical to verify that the
alignment LED spot(s) is co-located with the measurement beam.
1.
Align the 25nm calibration wafer on the standard sample stage. The
Sample Tilt position is now set.
2.
Flip the sample over so the rough side is facing up, or use a glossy
business card (recommended). If the business card is used, place it on
sample stage. Then, perform an intensity-based (Automatic-Quick) Z
height alignment at the desired AOI.
Figure 8-13. Sample Alignment – Intensity-based Z only.
3.
Block the measurement beam to view only the Alignment beam(s).
4.
Verify the Tilt Align Beam first. Select
Hardware
>
Controls
>
Misc
>‘Additional Hardware Functions’ to open the Hardware Functions
Digital Zoom Control
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