Bit
Description
1
Firmware error test (front-end error check:
whether the disk is in the controller disk
mode, whether the disk is in read-only
mode, and whether the available space is
below the threshold)
2
NAND test
3
NOR connectivity test
4
DDR uncorrectable error test
5
IBUF uncorrectable error test
6
Capacitor test
7
Blank block test: insufficient blank blocks
8
Life test
9
NOR patrol test
10
Firmware uncorrectable error test : four
invalid firmware backups
11
System area test too many bad blocks in the
NAND system area
12
Bad block test: too many bad blocks in the
NAND data area
13
Controller test: invalid controller
14
Power down fast interrupt request (FIQ) test
15
Formatting failure test
A.6.1.9 Obtaining the DIEID of a Chip
This command is used to obtain the DIEID, which is the unique identifier of a chip and is
used to track and manage information of the entire lifecycle (including chip manufacturing,
chip test, board processing, server test, and live network operation).
Test results are returned to the host through the host's physical memory that PRP1 and PRP2
point to. The data structure is defined in the following table.
Table A-33
DIEID structure
Bit
Description
3:0
Whether the DIEID is obtained successfully.
0
indicates a success
and the DIEID is displayed in bytes 4 to 27. Otherwise, the error
code is displayed in bytes 0 to 3.
ES3000 V3 NVMe PCIe SSD
User Guide
A Supported NVMe Commands
Issue 20 (2019-02-27)
Copyright © Huawei Technologies Co., Ltd.
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