GS66504B-EVBDB 650V
GaN E-HEMT Evaluation Board
User’s Guide
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GS66504B-EVBDB UG rev. 161120
© 2016 GaN Systems Inc.
www.gansystems.com 10
Please refer to the Evaluation Board/Kit Important Notice on page 29
WARNING!
ALWAYS double check the jumper setting and PWM gate drive signals
before applying power. Incorrect PWM inputs or jumper settings may cause
device failures
Test points:
Test points are designed in groups/pairs to facilitate probing:
Test points
Name
Description
TP1/TP2
+5V/0V
5V bias power
TP7/TP8
PWMIN/0V
PWM input signal from J7
TP4/TP3/TP13
PWMH/PWML/0V
High/low side gate signals to daughter board
TP9/TP10
VDC+/VDC-
DC bus voltage
TP11/TP12
VOUT/VDC-
Output voltage
TP6/TP5
VSW/VDC-
Switching node output voltage (for HV oscilloscope
probe)
Power connections:
CON1-CON7 mounting pads are designed to be compatible with following mounting terminals:
#10-32 Screw mount,
Banana Jack PCB mount (Keystone P/N: 575-4), or
PC Mount Screw Terminal (Keystone P/N: 8191)
Output passives (L and C14)
An external power inductor (not included) can be connected between VSW (CON1) and VOUT (CON4/5)
or VDC+ (CON2/3) for double pulse test. Users can choose their inductor size to meet the test
requirement. Generally it is recommended to use power inductor with low inter-winding capacitance to
obtain best switching performance. For the double pulse testing we use 2x 60uH/40Amp inductor (CWS,
P/N: HF467-600M-40AV) in series. C14 is designed to accommodate a film capacitor as output filter.
Double pulse test mode
