FujiFilm DR-ID 670, Руководство по эксплуатации

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For Safe Operation
1
DR-ID 670 Operation Manual 897N102735
Table 2
Guidance and manufacturer’s declaration - electromagnetic immunity
The DR-ID 670 is intended for use in the electromagnetic environment specified below.
The customer or the user of the DR-ID 670 should assure that they are used in such an environment.
Immunity test IEC 60601-1-2 test level Compliance level
Electromagnetic environment -
guidance
Electrostatic
discharge
(ESD)
IEC61000-4-2
±6kV contact
±8kV air
±6kV contact
±8kV air
Floors should be wood, concrete or
ceramic tile. If floors are covered with
synthetic material, the relative humidity
should be at least 30%.
Electrical fast
transient/burst
IEC61000-4-4
±2kV for power supply
lines
±1kV for input/output
lines
±2kV for power supply
lines
±1kV for input/output
lines
Mains power quality should be that
of a typical commercial or hospital
environment.
Surge
IEC61000-4-5
±1kV differential mode
±2kV common mode
±1kV differential mode
±2kV common mode
Mains power quality should be that
of a typical commercial or hospital
environment.
Voltage dips, short
interruptions and
voltage variations on
power supply input
lines
IEC61000-4-11
<5% U
T
(>95% dip in U
T
)
for 0.5 cycle
40% U
T
(60% dip in
U
T
)
for 5 cycles
70%
U
T
(30% dip in U
T
)
for 25 cycles
<5% U
T
(>95% dip in U
T
)
for 5 s
<5%
U
T
(>95% dip in U
T
)
for 0.5 cycle
40% U
T
(60% dip in
U
T
)
for 5 cycles
70%
U
T
(30% dip in U
T
)
for 25 cycles
<5% U
T
(>95% dip in U
T
)
for 5 s
Mains power quality should be that
of a typical commercial or hospital
environment. If the user of the DR-ID
670 requires continued operation
during power mains interruptions, it is
recommended that the DR-ID 670 be
powered from an uninterruptible power
supply or a battery.
Power frequency
(50/60Hz) magnetic
field
IEC61000-4-8
3 A/m 3 A/m
Power frequency magnetic fields should
be at levels characteristic of a typical
location in a typical commercial or
hospital environment.
NOTE:
U
T
is the a.c. mains voltage prior to application of the test level.