FISCHER FISCHERSCOPE X-RAY 5000 Series, Руководство оператора

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Product Administration Monitoring the measurement devices
50 FISCHERSCOPE
®
X-RAY
Technical background:
With the X-ray fluorescence method, as with any non-destructive
measurement method, the measurement data are calculated
indirectly.
The source signal is the spectrum of the X-ray fluorescence.
From this signal, the program computes the thickness of the
respective coatings and the concentrations of the alloy elements.
The user calibrates the measurement application using calibration
standards and stores the data in the product file. The correctness
of the measurement data is based on the correctness of the
measurement application. It is secured with the use of a certificate
that certifies the correctness and traceability of the calibration
standards and by checking and, if required, correcting the
measurement application with calibration standards.
As long as the instrument does not change, the calibrations, and
therefore the measurement data, will be correct. However, it is
likely that the instrument changes in the course of the years, for
example, through drift or wear. A measurement application can also
change through erroneous operation, e.g., through mis-adjusting
the measurement parameters or through erroneous normalization
or calibration. The user should, therefore check and, if necessary,
correct the measurement application at regular intervals.
This task is called monitoring the measurement device.
It concerns every individual measurement application, because
every measurement application has a special calibration with
special calibrations standards.
Monitoring of measurement devices concerns every individual
measurement application and not the instrument as a whole. It
avoids differing measurement results both within a production and
between supplier and customer.
Extensive information regarding monitoring of measurement
devices can be found in chapter 14 ‘Measurement device
monitoring for the Fischerscope X-RAY’, beginning on Page 92.