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New iStar ICCD
Operation
6.2.2.1.4.3 - advanced: burst/Fit Pulses per exposure
Description
Several gate pulses are generated within an exposure. For every successive exposure in the series, the gate delay
applied is incremented by the gate step value. For each exposure, the external trigger generates the first gate pulse,
subsequent gate pulses are generated internally via a user defined frequency or period. The maximum number of pulses
is applied that can fit into the exposure, given the final gate delay in the series, or the user defines the number of pulses
per exposure. Any subsequent triggers that arrive during the exposure.
Waveforms
Burst per Exposure
Fit to CCD Exposure
External Trigger
Fire
gate Monitor
ARM
External Trigger
Fire
gate Monitor
ARM