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MPOLx-85 / MPOLx-85P 45
7 PCM & PROBE O
PERATION
G
ENERAL INFORMATION
7
PCM & PROBE O
PERATION
General information
Dirty and/or damaged connectors are often the root cause of
optical network problems. The Probe and PCM applications
enable industry standard inspection and automated Pass/Fail
testing with report generation of optical connectors/adapters in
order to ensure industry standard fiber endface quality and
cleanliness.
For best workflow efficiency, there are two variants of fiber
microscopes available in the SmartClass™ Fiber family. The
integrated Patch Cord Microscope (PCM), which is best suited
for inspecting fiber endfaces of patch cords, and the external
P5000i Digital Probe (see “Accessories” on page 71 ), which may
be used either for bulkhead inspection or patch cord inspection.
The shortest inspection time is achieved when using one of the
MPOLx-85P models with an integrated PCM for patch cord
inspection and a P5000i Digital Probe for bulkhead inspection.
Both applications – Probe and PCM – behave essentially the
same and are described together below.
Note: Only if a P5000i Digital Probe is connected to the instrument the
Probe application is fully functional.
All instruments with a trailing "P" in their model name
(e.g. OLT-85P) provide PCM functionality.
The build in Patch Cord Microscope (PCM)
The PCM is a microscope used to view and inspect patch cord
(male) sides of fiber connectors.
In order to support a wide variety of fiber optic connectors, the
PCM provides an exchangable FMAE adapter. The dedicated
QuickCapture key enables either instant triggering of a Pass/Fail
test or freezing of the live image. For best workflow adaption,
the key action is configurable. The dedicated Magnification
Control key provides fast toggling between two microscope
magnification levels: low magnification (around 23000 dpi) for
overview inspection of the fiber endface, and high magnification
(around 46000 dpi) for detailed inspection of the fiber endface.