VeEX VePal TX130M+, User Manual

Page: 31 / 175

Go back to top Go back to ToC
Data Tab:
User selects a test pattern that will be encapsulated in the Ethernet frame payload (for framed mode).
Depending on the test layer, different test pattern options are available;
Layer 1 test patterns:
CRPAT:
Compliant Random Pattern provides broad spectral content and minimal peaking for the
measurement of jitter at component or system level.
CJTPAT:
Compliant Jitter Test Pattern is a Jitter Tolerance Pattern that stresses a receiver by exposing it to
extreme phase jumps thereby stressing the Clock Data Recovery (CDR) circuitry. The pattern alternates
between repeating low transition density patterns and repeating high transition density patterns.
CSPAT
BERT Setup - Test Pattern (Layer 1 Framed
)
Go back to top Go back to ToC
Layer 2 & 3 test patterns:
PRBS:
2^31 -1 (147 483 647-bit pattern used for special measurement tasks, e.g. delay measurements at higher bit
rates)
2^23 -1 (8 388 607-bit pattern primarily intended for error and jitter measurements at bit rates of 34 368 and
_e-manual_D07-00-051P_RevD00