8.15.4 Comparators
8.15.4.1 Low-Power Clocked Comparator
T
c
= 25 °C, V
DDS
= 3.0 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX UNIT
Input voltage range
0
V
DDS
V
Clock frequency
SCLK_LF
Using internal DAC with VDDS as reference
voltage, DAC code = 0 - 255
0.024 -
2.865
V
Offset
Measured at V
DDS
/ 2, includes error from
internal DAC
±5
mV
Decision time
Step from –50 mV to 50 mV
1
Clock
Cycle
(1)
The comparator can use an internal 8 bits DAC as its reference. The DAC output voltage range depends on the reference voltage
selected. See
8.15.4.2 Continuous Time Comparator
T
c
= 25°C, V
DDS
= 3.0 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
0
V
DDS
V
Offset
Measured at V
DDS
/ 2
±5
mV
Decision time
Step from –10 mV to 10 mV
0.78
µs
Current consumption
Internal reference
8.6
µA
(1)
The input voltages can be generated externally and connected throughout I/Os or an internal reference voltage can be generated using
the DAC
8.15.5 Current Source
8.15.5.1 Programmable Current Source
T
c
= 25 °C, V
DDS
= 3.0 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX UNIT
Current source programmable output range
(logarithmic range)
0.25 - 20
µA
Resolution
0.25
µA
SWRS232D – FEBRUARY 2019 – REVISED FEBRUARY 2021
Copyright © 2021 Texas Instruments Incorporated
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