10
MSP430G2533, MSP430G2433, MSP430G2333, MSP430G2233
MSP430G2403, MSP430G2303, MSP430G2203
SLAS734G – APRIL 2011 – REVISED APRIL 2016
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MSP430G2533 MSP430G2433 MSP430G2333 MSP430G2233 MSP430G2403 MSP430G2303
MSP430G2203
Terminal Configuration and Functions
Copyright © 2011–2016, Texas Instruments Incorporated
(1)
MSP430G2x33 devices only
4.2
Signal Descriptions
Table 4-1
describes the signals.
Table 4-1. Terminal Functions
TERMINAL
I/O
DESCRIPTION
NAME
NO.
PW20,
N20
PW28
RHB32
P1.0/
2
2
31
I/O
General-purpose digital I/O pin
TA0CLK/
Timer0_A, clock signal TACLK input
ACLK/
ACLK signal output
A0
ADC10 analog input A0
(1)
P1.1/
3
3
1
I/O
General-purpose digital I/O pin
TA0.0/
Timer0_A, capture: CCI0A input, compare: Out0 output / BSL transmit
UCA0RXD/
USCI_A0 receive data input in UART mode
UCA0SOMI/
USCI_A0 slave data out/master in SPI mode
A1
ADC10 analog input A1
(1)
P1.2/
4
4
2
I/O
General-purpose digital I/O pin
TA0.1/
Timer0_A, capture: CCI1A input, compare: Out1 output
UCA0TXD/
USCI_A0 transmit data output in UART mode
UCA0SIMO/
USCI_A0 slave data in/master out in SPI mode
A2
ADC10 analog input A2
(1)
P1.3/
5
5
3
I/O
General-purpose digital I/O pin
ADC10CLK/
ADC10, conversion clock output
(1)
A3/
ADC10 analog input A3
(1)
VREF-/VEREF-
ADC10 negative reference voltage
(1)
P1.4/
6
6
4
I/O
General-purpose digital I/O pin
SMCLK/
SMCLK signal output
UCB0STE/
USCI_B0 slave transmit enable
UCA0CLK/
USCI_A0 clock input/output
A4/
ADC10 analog input A4
(1)
VREF+/VEREF+
ADC10 positive reference voltage
(1)
TCK
JTAG test clock, input terminal for device programming and test
P1.5/
7
7
5
I/O
General-purpose digital I/O pin
TA0.0/
Timer0_A, compare: Out0 output / BSL receive
UCB0CLK/
USCI_B0 clock input/output
UCA0STE/
USCI_A0 slave transmit enable
A5/
ADC10 analog input A5
(1)
TMS
JTAG test mode select, input terminal for device programming and test
P1.6/
14
22
21
I/O
General-purpose digital I/O pin
TA0.1/
Timer0_A, compare: Out1 output
A6/
ADC10 analog input A6
(1)
UCB0SOMI/
USCI_B0 slave out/master in SPI mode,
UCB0SCL/
USCI_B0 SCL I
2
C clock in I
2
C mode
TDI/TCLK
JTAG test data input or test clock input during programming and test