Logical Operations
Test and Change Memory Instructions
The compare (CMPx) and test (Txxx) instructions allow the ability to test values in memory. The
results of these operations can then trigger subsequent conditional branches. The CMPx instruc-
tion allows comparison of memory with respect to a specified constant value, while the Txxx in-
structions allow any single bit to be extracted to the test control (TC) field of status register 0.
The contents of the accumulator can also be non-destructively analyzed to establish branching
conditions, as seen below.
Test and Change Memory
Instruction
Execution Affects
TBIT loc16,#(0-15)
ST0(TC) = loc16(bit_no)
TC
TSET loc16,#(0-15)
Test (loc16(bit)) then set bit
TC
TCLR loc16,#(0-15)
Test (loc16(bit)) then clr bit
TC
CMPB
AX, #8bit
Test (AX - 8bit unsigned)
C,N,Z
CMP AX, loc16
Test (AX – loc16)
C,N,Z
CMP loc16,#16b
Test (loc16 - #16bit signed)
C,N,Z
CMPL
ACC, @P
Test (ACC - P << PM)
C,N,Z
C - 16
C28x - Appendix C - Assembly Programming
Summary of Contents for C28 Series
Page 64: ...Summary 3 16 C28x Peripheral Registers Header Files ...
Page 78: ...Interrupt Sources 4 14 C28x Reset and Interrupts ...
Page 218: ...Lab 9 DSP BIOS 9 22 C28x Using DSP BIOS ...
Page 244: ...Lab 10 Programming the Flash 10 26 C28x System Design ...
Page 273: ...Appendix A eZdsp F2812 C28x Appendix A eZdsp F2812 A 1 ...
Page 276: ...Appendix P2 Expansion Interface A 4 C28x Appendix A eZdsp F2812 ...
Page 277: ...Appendix P4 P8 P7 I O Interface C28x Appendix A eZdsp F2812 A 5 ...
Page 278: ...Appendix A 6 C28x Appendix A eZdsp F2812 ...
Page 279: ...Appendix P5 P9 Analog Interface C28x Appendix A eZdsp F2812 A 7 ...
Page 282: ...Appendix A 10 C28x Appendix A eZdsp F2812 TP1 TP2 Test Points ...