Section 9: PMU for pulsed I-V measurements on a MOSFET
Model 4200A-SCS Parameter Analyzer User's Manual
9-4
4200A-900-01 Rev. C / January 2019
At the output of each RPM, connect the triaxial to BNC adapter, BNC to SMA adapter, and finally the
SMA-to-SMA cable.
Connect the SMA cables to either probes or a test fixture that is connected to the MOSFET. RPM1 is
connected to the gate of the MOSFET and RPM2 is connected to the drain of the MOSFET.
The shields of the SMA cables are the PMU LO connection and must be connected to the source and
bulk terminals of the MOSFET. The shields of the two SMA cables should be connected together as
close as possible to the device.
The example below illustrates connections from the RPMs to the SMA to SSMC adapter cables
(4200-PRB-C) and then to the probes and device terminals on a wafer. For more information on these
and similar connections, see the
Model 4200A-SCS Reference Manual
.
Figure 127: Connections from RPM outputs to the MOSFET on a wafer
Set up the measurements in Clarius
This section describes how to set up the Clarius application to make a pulsed I-V sweep on a
MOSFET.
For this example, you will use the Clarius application to:
Create a new project
Search for and select an existing test
Configure the test
Run the test and analyze the results
