Electrical characteristics
STM32F103xx
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Wakeup time from low power mode
is measured on a wakeup phase with a 8-MHz HSI RC
oscillator. The clock source used to wake up the device depends from the current operating
mode:
●
Stop or Standby mode: the clock source is the RC oscillator
●
Sleep mode: the clock source is the clock that was set before entering Sleep mode.
All timings are derived from tests performed under ambient temperature and V
DD
supply
voltage conditions summarized in
.
5.3.8 PLL
characteristics
The parameters given in
are derived from tests performed under ambient
temperature and V
DD
supply voltage conditions summarized in
.
Table 21.
Low-power mode wakeup timings
(1)
1.
TBD stands for to be determined.
Symbol
Parameter
Conditions
Typ
Max
Unit
t
WUSLEEP
(2)
2.
The wakeup time from Sleep and Stop mode are measured from the wakeup event to the point in which the
user application code reads the first instruction.
Wakeup from Sleep mode
Wakeup on HSI RC clock
0.75
TBD
µs
t
WUSTOP
(2)
Wakeup from Stop mode
(regulator in run mode)
HSI RC wakeup time = 2 µs
4
TBD
µs
Wakeup from Stop mode
(regulator in low power mode)
HSI RC wakeup time = 2 µs,
Regulator wakeup from LP
mode time = 5 µs
7
TBD
t
WUSTDBY
(3)
3.
The wakeup time from Standby mode is measured from the wakeup event to the point in which the device
exits from reset.
Wakeup from Standby mode
HSI RC wakeup time = 2 µs,
Regulator wakeup from power
down time = 38 µs
40
TBD
µs
Table 22.
PLL characteristics
(1)
1.
TBD stands for to be determined.
Symbol
Parameter
Test Conditions
Value
Unit
Min
Typ
Max
(2)
2.
Data based on device characterization, not tested in production.
f
PLL_IN
PLL input clock
8.0
MHz
PLL input clock duty cycle
40
60
%
f
PLL_OUT
PLL multiplier output clock
16
72
MHz
f
VCO
VCO frequency range
When PLL operates
(locked)
32
144
MHz
t
LOCK
PLL lock time
200
µs
t
JITTER
Cycle to cycle jitter (+/-3
Σ
peak to peak)
V
DD
is stable
TBD
TBD
%