ST STM32F103x6, Manual

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STM32F103xx Electrical characteristics
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5.3.6 External clock source characteristics
High-speed external user clock
The characteristics given in Table 15 result from tests performed using an high-speed
external clock source, and under ambient temperature and supply voltage conditions
summarized in
Table 7 .
Low-speed external user clock
The characteristics given in Table 16 result from tests performed using an low-speed
external clock source, and under ambient temperature and supply voltage conditions
summarized in
Table 7 .
Table 15. High-speed external (HSE) user clock characteristics
Symbol Parameter Conditions Min Typ Max Unit
f
HSE_ext
User external clock source
frequency
(1)
1. Value based on design simulation and/or technology characteristics. It is not tested in production.
8 25 MHz
V
HSEH
OSC_IN input pin high level
voltage
0.7V
DD
V
DD
V
V
HSEL
OSC_IN input pin low level
voltage
V
SS
0.3V
DD
t
w(HSE)
t
w(HSE)
OSC_IN high or low time
(1)
16
ns
t
r(HSE)
t
f(HSE)
OSC_IN rise or fall time
(1)
5
I
L
OSC_IN Input leakage
current
V
SS
≤
V
IN
≤
V
DD
±1 µA
Table 16. Low-speed external user clock characteristics
Symbol Parameter Conditions Min Typ Max Unit
f
LSE_ext
User External clock source
frequency
(1)
1. Value based on design simulation and/or technology characteristics. It is not tested in production.
32.768 1000 kHz
V
LSEH
OSC32_IN input pin high level
voltage
0.7V
DD
V
DD
V
V
LSEL
OSC32_IN input pin low level
voltage
V
SS
0.3V
DD
t
w(LSE)
t
w(LSE)
OSC32_IN high or low time
(1)
450
ns
t
r(LSE)
t
f(LSE)
OSC32_IN rise or fall time
(1)
5
I
L
OSC32_IN Input leakage
current
V
SS
≤
V
IN
≤
V
DD
±1 µA