2-24
Specifications
Date Code 20000421
SEL-251, -2, -3 Instruction Manual
STATUS message with the socket designation of the affected RAM IC. A RAM failure disables
protective and control functions and closes the ALARM output relay contacts.
Read-Only Memory
The relay checks read-only memory (ROM) by computing a checksum. If the computed value
does not agree with the stored value, the relay declares a ROM failure. It transmits a STATUS
message with the socket designation of the affected ROM IC. A ROM failure disables protective
and control functions and closes the ALARM output relay contacts.
Analog-to-Digital Converter
The analog-to-digital converter (ADC) changes voltage signals derived from power system volt-
ages and currents into numbers for processing by the microcomputer. The ADC test verifies
converter function by checking conversion time. The test fails if conversion time is excessive or
a conversion starts and never finishes. There is no warning state for this test. While an ADC
failure disables protective functions, control functions remain intact. The relay transmits a
STATUS message and closes the ALARM relay contacts.
Master Offset
The master offset (MOF) test checks offset in the multiplexer/analog to digital converter circuit.
A grounded input is selected and sampled for dc offset. The warning threshold is 50 mV; failure
threshold is 75 mV. A failure pulses the ALARM contact closed for one second. The relay
transmits a STATUS message for both warning and failure conditions.
Settings
The relay stores two images of the system settings in nonvolatile memory. The test compares
them when the relay is initially set and periodically thereafter. If the images disagree, the setting
test fails and the relay disables all protective and control functions. It transmits the STATUS
message to indicate a failed test. The ALARM relay remains closed after a setting failure.
Table 2.5 shows relay actions for any self-test condition: warning (W) or failure (F).