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496339 Issue 4
Table 4. IDIS Module Current Readings
Circuit
Reading
Meaning
A1 (Tamper) 1.5mA
Tamper loop shorted to 0V.
3mA
Open tamper circuit.
3-4mA
Potential tamper fault.
4-5mA
Voltage drop on 0V line.
5-6mA
Good (closed) circuit.
A2 (Alarm)
0mA
Open alarm circuit.
3mA
Good (closed) circuit.
5.5mA
Alarm loop shorted to bus.
A1 & A2
Fluctuating Either data corruption on bus lines, or too much
current being drawn from Programmer. Connect a
12V supply to the Programmer and try again.
Remember to reference to 0V sources where
necessary.
3.
For devices other than LIMs try completely disconnecting the device
from its sensor or contacts and looping both the tamper and alarm loops
locally at the module. If that removes the fault then check the wiring of
the tamper/alarm circuits for faults to ground. Check also that the sensor
connected to the module has volt-free contacts and no capacitors fitted
across contacts.
If a fault still cannot be fixed by changes to that module or its immediate
wiring then carry on testing using the Thorough Test Method.
Thorough Test Method
1.
The IDIS bus may be affected by excessive voltage drop along the 0V
wire. To check the voltage drop (use the same meter for all readings):
a)
Check the voltage between 0V an Sig at the Expander Card
(typically 7.8V).
b)
Check the voltage between 0V and Sig at the extreme end of each
cable run.
c)
If the difference between the two voltages is more than 1.2V then
carry out the suggestions in "Improving the Voltage Drop".
Notes:
a) The voltage reading will vary according to the make/type of meter you use.
b) A Fluke DVM type 83 will read typically 7.8V between 0V and Sig at the
panel.
c) IDIS outputs changing state will change this voltage slightly so do the test
with outputs static.
d) Remember to make sure that anything that can draw current along the 0V
wire is doing so at the time of the measurement.
Improving the Voltage Drop
8136
Summary of Contents for 8136UK-50
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