Detailed Descriptions
63
D124
3.5 IMAGE TROUBLESHOOTING
Internal Test Patterns
2902
Internal Test Pattern Select - MCU Internal Patterns
Pattern
0
No Test Pattern Output
1
Vertical 1 Dot Line
2
Vertical 2 Dots Line
3
Horizontal 1 Dot Line
4
Horizontal 2 Dots Line
5
Checkers 1 Dot Line
6
Checkers 2 Dots Line
7
Oblique Checkers 1 Dot Line
8
Oblique Checkers 2 Dots Line
9
Checker Flag
10
Nozzle Check Pattern
11
All Solid
IPU Test Patterns
4417
IPU Test Pattern Setting - Pattern Selection
No.
Pattern Name
0
Scanned Image
1
Gradation Main Scan A
2
Gradation Sub Scan B
3
Gradation RGBCMYK
4
Grid Pattern A
5
Slant Grid Pattern A
6
S Grid Pattern A
7
S Slant Grid A
8
Grid Pattern B
9
S Grid Pattern B
10
Color Patch 16
11
Gradation Main Scan C
12
Gradation Sub Scan C
13
Slant Grid Pattern C
14
S Grid Pattern C
Summary of Contents for D124
Page 1: ...D124 DETAILED DESCRIPTIONS MANUAL ...
Page 2: ......
Page 20: ...D124 14 Detailed Descriptions 1 2 GENERAL LAYOUT ...
Page 24: ...D124 18 Detailed Descriptions 1 4 MOTORS CLUTCHES AIR RELEASE SOLENOID ...
Page 28: ...D124 22 Detailed Descriptions 1 6 ORIGINAL PATH PAPER PATH SENSORS ...
Page 62: ...D124 56 Detailed Descriptions 3 1 2 SCAN JOB IMAGE DATA FLOW 3 1 3 PRINT JOB IMAGE DATA FLOW ...