ChipSHOUTER Users Manual
: Troubleshooting
63
Troubleshooting
Symptom
Possible Cause
Solution
Arming fails.
•
Active fault condi-
tion.
•
Check faults via serial
port or API.
•
Check temperature of
unit.
•
Check for toggling sig-
nal on external inputs.
Device resets during
use.
•
During high-current
discharge, sufficient
noise can cause self-
reset of the device.
•
Change voltage settings
and/or increase pulse
width.
•
Using API to detect de-
vice reset, recover from
fault.
Excessive “sensor
faults” when using
external trigger.
•
Insufficient time
for self-checks to oc-
cur between triggers.
•
Send “triggersafe” com-
mand before each external
trigger event.
•
Slow down external
triggers.
Using external hard-
ware trigger causes
probe open fault.
•
External trigger is
rapidly repeating many
times (for example,
being driven with an
ungated signal genera-
tor), and the safety
checks cannot occur.
•
Limit the fault inser-
tion to occur in bursts
at a time, providing a
space for the device to
perform safety checks.
•
Send “triggersafe” com-
mand before each burst.
Excessive “sensor
faults” when using
external trigger.
--or--
Device disarms during
use, even though ex-
ternal trigger used to
pulse device.
•
External trigger
level is insufficient,
causing triggering of
MOSFET but the system
monitor is unaware.
•
Confirm level of trig-
ger input. If using 50-
ohm termination temporar-
ily turn this off to
increase drive level.
