ChipSHOUTER Users Manual
: Fault Modes
48
If the ChipSHOUTER is armed when a probe is removed,
this immediately causes a latched fault. As the probe
SHOULD
NEVER
be removed from the ChipSHOUTER when armed, this is a
serious fault condition. When switching probe tips, note it
is much quicker to disarm the ChipSHOUTER, switch tops, and
re-arm it. The latched fault condition is by design slow to
clear, as during probe changes you should always disarm the
ChipSHOUTER first.
If using the external hardware trigger input, you may
get this fault if inserting large batches of faults with
minimal delay between them (e.g., using a simple pulse-wave
from a signal generator). You should instead gate the output
to only enable faults for short bursts, and prove the Chip-
SHOUTER time to perform safety checks in-between bursts.
Over-Temperature Fault
The ChipSHOUTER contains three temperature sensors. These
sensors are on the MOSFET (electronic switch), the e.m.f.
catch diodes, and the transformer used to generate the high
voltage.
If any of these devices are over-temperature, the Chip-
SHOUTER will shut down. This fault condition automatically
clears once the device cools down.
The temperature sensors cannot be read during the dis-
charge event. If using the external hardware trigger in
quick succession, you may also get an error indicating a
temperature sensor fault. This occurs when the ChipSHOUTER
is unable to check the device temperatures for a predeter-
mined time.
If using the external trigger, it is recommended to also
send the
triggersafe
command over the serial interface dur-
