
189
CHAPTER 4 DISPLAY UNIT FUNCTIONS
4
4.
2
C
P
U Monit
o
r/
T
e
st
4.
2.
1
Devic
e
m
o
nit
o
r/
te
st
(2) Devices that can be monitored/tested
The following shows devices that can be monitored and tested by device monitor/test. Note that local devices
cannot be monitored and tested.
*1
Digit-specified devices, devices specified by indirect specification, and bit-specified devices cannot be set.
*2
Device test cannot be executed.
(3) Specifying a device to be monitored or tested
Perform the following operation.
*3
The device number is displayed in decimal or hexadecimal, according to the notation of each device. Regardless of the
notation, the device number is displayed with the number of digits that can be set.
Type
Device
*1
Bit device
X, Y, M, L, B, F, SB, V, SM, T (contact, coil
*2
), ST (contact, coil
*2
), C (contact, coil
*2
)
Word device
D, D (extended data register), W, W (extended link register), SW, SD, Z, R, ZR, T (current value), ST (current value),
C (current value)
"Device monitor" screen
1.
Press the
button.
↓
"Device selection" screen
2.
Select a target device using the
and
buttons
and press the
button.
↓
"Device No. setting" screen
3.
Move the cursor using the
and
buttons,
increase or decrease a device number
*3
using the
and
buttons, and press the
button.
OK
OK
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