18
The function X-VALUE enables you to set
the X-Value (distance between the probe’s
leading face and probe index/sound exit
point) of the probe used. This value is
required for the automatic calculation of the
reduced projection distance in angle beam
transducer operation.
Adjustment range: 0~50 mm
4.18 Probe Delay Calibration
Each probe has a delay line between the transducer element and the coupling face. This means that the
initial pulse must first pass through this delay line before the sound wave can enter the test object. You
can compensate for this influence of the delay line in the function P-DELAY.
If the value for P-DELAY is not known, read Chapter 5 in order to determine this value.
4.19 Setting the Angle of Incidence
The ANGLE function enables you to adjust the angle of incidence of your probe for the material used.
This value is required for the automatic calculation of the flaw position. The angle of incidence for the
straight-beam probe is fixed to 0°.
Adjustment range: 0°~80°.
4.20 Magnifying the Contents of a Gate
Whenever an A-Scan is active, pressing the
key enlarges the displayed portion of the A-Scan
contained in the selected gate. Any of the available gates may be specified as the selected gate. The
width of the magnified gate determines the level of magnification since the display is magnified until the
gate width equals the full-screen width. The display will contain the magnified view until pressing
again.
Before Magnifying
After Magnifying
4.21 Freezing the A-Scan Display
Whenever an A-Scan is active, pressing
freezes the A-Scan display. The active A-Scan will remain
as it appeared when
was pressed and the display will remain frozen until
is pressed again.
4.22 Setting the Display Grid
1
Activate the SYS submenu (located in the CFG menu) by pressing the menu key below it. Four
functions will appear down the right side of the display screen.
2
Select the function item titled GRID.
3
To change the grid type, Press
key or turn the knob. Each grid style is shown in the
