METREL MI 3100 S EurotestEASI, Instruction Manual

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MI 3100 s, MI 3100 SE Eurotest EASI Measurements
25
Trip-out times according to EN 60364-4-41:
½

I

N
*)
I

N
2

I

N
5

I

N
General RCDs
(non-delayed)
t

> 999 ms t

< 999 ms t

< 150 ms t

< 40 ms
Selective RCDs
(time-delayed)
t

> 999 ms 130 ms < t

< 999 ms 60 ms < t

< 200 ms 50 ms < t

< 150 ms
Trip-out times according to BS 7671:
½

I

N
*)
I

N
2

I

N
5

I

N
General RCDs
(non-delayed)
t

> 1999 ms t

< 300 ms t

< 150 ms t

< 40 ms
Selective RCDs
(time-delayed)
t

> 1999 ms 130 ms < t

< 500 ms 60 ms < t

< 200 ms 50 ms < t

< 150 ms
Trip-out times according to AS/NZS 3017
**)
:
½

I

N
*)
I

N
2

I

N
5

I

N
RCD type
I

N
[mA] t

t

t

t

Note
I

10
> 999 ms
40 ms 40 ms 40 ms
Maximum break time
II
> 10

30
300 ms 150 ms 40 ms
III > 30 300 ms 150 ms 40 ms
IV
S
> 30 > 999 ms
500 ms 200 ms 150 ms
130 ms
60 ms 50 ms Minimum non-actuating time
*)
Minimum test
period for current of ½

I

N
, RCD shall not trip-out.
**)
Test current and measurement accuracy correspond to AS/NZS 3017 requirements.
Maximum test times related to selected test current for general (non-delayed) RCD
Standard
½

I

N
I

N
2

I

N
5

I

N
EN 61008 / EN 61009 300 ms 300 ms 150 ms 40 ms
EN 60364-4-41 1000 ms 1000 ms 150 ms 40 ms
BS 7671 2000 ms 300 ms 150 ms 40 ms
AS/NZS 3017 (I, II, III) 1000 ms 1000 ms 150 ms 40 ms
Maximum test times related to selected test current for selective (time-delayed) RCD
Standard
½

I

N
I

N
2

I

N
5

I

N
EN 61008 / EN 61009 500 ms 500 ms 200 ms 150 ms
EN 60364-4-41 1000 ms 1000 ms 200 ms 150 ms
BS 7671 2000 ms 500 ms 200 ms 150 ms
AS/NZS 3017 (IV) 1000 ms 1000 ms 200 ms 150 ms
Note:

Trip-out limit times for PRCD, PRCD-K and PRCD-S are equal to General (non-delayed)
RCDs.
4.3.5 Isc factor
In this menu the Isc factor for calculation of
short circuit current in Z-LINE and Z-LOOP
measurements can be set.
Figure 4.8: Selection of Isc factor