MI 3155
Eurotest
XD
Appendix A
– Profile notes
217
Appendix A Profile notes
Instrument supports working with multiple Profiles. This appendix contains collection of minor
modifications related to particular country requirements. Some of the modifications mean
modified listed function characteristics related to main chapters and others are additional
functions. Some minor modifications are related also to different requirements of the same
market that are covered by various suppliers.
A.1
Profile Austria (ATAF)
Testing special delayed G type RCD supported.
Modifications in chapter
Special delayed G type RCD selection added in the
Selectivity
parameter in
Test Parameters /
Limits
section as follows:
Selectivity Characteristic
[--, S, G]
Time limits are the same as for general type RCD and contact voltage is calculated the same as
for general type RCD.
Selective (time delayed) RCDs and RCDs with (G) - time delayed characteristic demonstrate
delayed response characteristics. They contain residual current integrating mechanism for
generation of delayed trip out. However, contact voltage pre-test in the measuring procedure
also influences the RCD and it takes a period to recover into idle state. Time delay of 30 s is
inserted before performing trip-out test to recover S type RCD after pre-tests and time delay of 5
s is inserted for the same purpose for G type RCD.
Table 7.2: Relationship between Uc, Uc(P) and I
RCD type
Contact voltages Uc and Uc(P)
proportional to
Rated I
N
AC, EV, MI (a.c. part)
--
G
1.05
I
N
any
AC
S
2
1.05
I
N
A, F
--
G
1.4
1.05
I
N
30 mA
A, F
S
2
1.4
1.05
I
N
A, F
--
G
2
1.05
I
N
< 30 mA
A, F
S
2
2
1.05
I
N
B, B+
--
2
1.05
I
N
any
B, B+
S
2
2
1.05
I
N
Technical specifications unchanged.