Malvern Zetasizer Nano Series, Accessories Manual

Page: 54 / 126

Chapter 3 Surface zeta potential cell
Page 3-12 MAN 0487
SZP measurement - Advanced
Refer to the
Measurement - Material
description in the
zeta potential SOPs
section of the main user manual.
Settings Description
SZP
measurement
duration The SZP ( Surface zeta potential ) measurement duration
options are the same as standard measurement duration
options available during normal zeta potential
measurements.
SZP
measurements The SZP measurements options define the number of
repeat measurements made at each displacement away
from the surface and the length of any delay between repeat
measurements.
SZP
displacement The SZP displacement options define the distances to be
used during a surface zeta potential measurement. The
Number of positions defines the number of points away
from the surface where tracer mobility is to be measured.
The Size of steps defines the additional distance away from
the surface that each measurement is made. Note that 500
microns can only be chosen if the
tracer measurement
displacement (in the tracer measurement SOP window) is
set to 1500 microns or greater. This is to ensure that a
minimum of three displacement points will be measured.