Self-Test Procedures
A power-on self-test occurs automatically when you turn on the waveform generator. This limited test assures you
that the waveform generator is operational.
Press [System] > Instr. Setup > Self Test to perform the complete self-test of the waveform generator. It takes
approximately 12 seconds for the self-test to complete.
You can also perform a complete self-test from the remote interface, see Programming Guide for details.
– If the self-test is successful, "Self test passed" is displayed on the front panel.
– If the self-test fails, "
" is displayed on the front panel. Press [System] > Help > Error View to record the error
code and message and contact Keysight support if necessary.
– If the self-test is successful, this indicates a high chance that the waveform generator is operational.
Self-Test Error
The self test (see the *TST? command) performs a series of tests on the instrument hardware.
A failure can generate multiple error messages; the first one should be considered the primary cause of failure.
Some error messages include a failing channel number (1 or 2), shown as n in the messages below.
Error Code Error Messages
601
Self-test failed; real time clock settings lost
602
Self-test failed; main CPU power supply out of range
603
Self-test failed; main CPU error accessing boot env
604
Self-test failed; front panel processor ping failed
605
Self-test failed; waveform FPGA not programmed
606
Self-test failed; waveform FPGA revision check failed
607
Self-test failed; waveform FPGA read back error
608
Self-test failed; waveform FPGA security check failed
609
Self-test failed; waveform FPGA security check failed
610
Self-test failed; main PLL not locked
611
Self-test failed; FPGA PLL not locked
612
Self-test failed; Chan n, waveform memory PLL not locked
613
Self-test failed; Chan n, waveform memory not initialized
615
Self-test failed; modulation ADC offset too low (too high)
616
Self-test failed; modulation ADC reference too low (too high)
620
Self-test failed; Chan n, waveform memory test failed on idle
621
Self-test failed; Chan n, waveform memory test failed
625
Self-test failed; Chan n, waveform DAC gain[idx] too low (too high)
630
Self-test failed; Chan n, sub attenuator failure 0dB
10
Keysight EDU33210 Series Service Guide
