15. Electrical Characteristics
255
Tsi384 User Manual
May 5, 2014
Integrated Device Technology
www.idt.com
Note that all Figure and Section references are to the
PCI Express Base Specification (Revision 1.1)
.
1. No test load is necessarily associated with this value.
2. Specified at the measurement point into a timing and voltage compliance test load as shown in Figure 4-25 and measured
using the clock recovery function in Section 4.3.3.2. (also see the transmitter compliance eye diagram in Figure 4-24).
3. A T
TX-EYE
= 0.75 UI provides for a total sum of deterministic and random jitter of T
TX-JITTER-MAX
= 0.25 UI for the Transmitter
using clock recovery function specified in Section 4.3.3.2. The T
TX-EYE-MEDIAN-to-MAX-JITTER
specification ensures a jitter
distribution in which the median and the maximum deviation from the median is less than half the total TX jitter budget using
the clock recovery function specified in section 4.3.3.2. It should be noted that the median is not the same as the mean. The
jitter median describes the point in time where the number of jitter points on either side is approximately equal as opposed the
averaged time value. This parameter is to be met at the target bit error rate. The T
TX_EYE_MEDIAN-to-MAX-JITTER
is to be met
using the compliance pattern at a sample size of 1,000,000 UI.
4. The Transmitter input impedance shall result in a differential return loss greater than or equal to 10 dB with a differential test
input signal no less than 200mV (peak value, 400 mV differential peak to peak) swing around ground applied to D+ and D-
lines and a common mode return loss greater than or equal to 6 dB over a frequency range of 50 MHz to 1.25 GHz. This input
impedance requirement applies to all valid input levels. the reference impedance for return loss measurements is 50 Ohms to
ground for both D+ and D- line (that is, as measured by a vector Network Analyzer with 50 Ohm probes - see Figure 4-25).
Note that the series capacitors C
TX
is optional for the return loss measurement.
5. Measured between 20-80% at the Transmitter package pins into a test load as shown in Figure 4-25 for both V
TX-D+
and
V
TX-D-
.
6. Z
TX-DIFF-DC
is the small signal resistance of the transmitter measured at a DC operating point that is equivalent to that
established by connecting a 100-Ohm resistor from D+ and D- while the TX is driving a static logic one or logic zero.
Equivalently, this parameter can be derived by measuring the RMS voltage of the TX while transmitting a test pattern into two
different differential terminations that are near 100 Ohms. Small signal resistance is measured by forcing a small change in
differential voltage and dividing this by the corresponding change in current.
Summary of Contents for TSI384
Page 1: ... IDT Tsi384 PCIe to PCI Bridge User Manual May 5 2014 ...
Page 10: ...Contents 10 Tsi384 User Manual May 5 2014 Integrated Device Technology www idt com ...
Page 56: ...4 Addressing 56 Tsi384 User Manual May 5 2014 Integrated Device Technology www idt com ...
Page 74: ...6 Bridging 74 Tsi384 User Manual May 5 2014 Integrated Device Technology www idt com ...
Page 78: ...7 PCI X Arbitration 78 Tsi384 User Manual May 5 2014 Integrated Device Technology www idt com ...
Page 136: ...12 Serial EEPROM 136 Tsi384 User Manual May 5 2014 Integrated Device Technology www idt com ...
Page 142: ...13 JTAG 142 Tsi384 User Manual May 5 2014 Integrated Device Technology www idt com ...
Page 268: ...16 Packaging 268 Tsi384 User Manual May 5 2014 Integrated Device Technology www idt com ...
Page 276: ...276 Tsi384 User Manual May 5 2014 Integrated Device Technology www idt com ...
Page 280: ...Index 280 Tsi384 User Manual May 5 2014 Integrated Device Technology www idt com ...