ZEN-LOG-MAN-16V03 (0930)
Copyright © 2016 Define Instruments
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A
APPENDIX A - EMC TEST RESULTS
Statement of compliance
Products in the Define Instruments 'Zen' series comply with EN 61326-1:2006.
Results summary
The results from testing carried out in March 2014 are summarized in the following tables.
Immunity - Enclosure Ports
Phenomenon
Basic Standard Test Value
Performance Criteria
EM Field
IEC 61000-4-3
10Vm (80MHz to 1GHz)
3V/m (1.4–2.7GHz)
Meets Criterion A
Electrostatic
Discharge (ESD)
IEC 61000-4-2
4kV/8kV contact/air
Meets Criterion A (Note 1)
Meets NAMUR NE 21
recommendation
Immunity - Signal Ports
Phenomenon
Basic Standard Test Value
Performance Criteria
Conducted RF
IEC 61000-4-6
3V (150kHz to 80MHz)
Meets Criterion A
Burst
IEC 61000-4-4
1kV (5/50ns, 5kHz)
1kV (5/50ns, 100kHz)
Meets Criterion A (Note 1)
Meets NAMUR NE 21
recommendation
Surge
IEC 61000-4-5
1kV L-E
Meets Criterion A (Note 1)
Immunity - AC Power
Phenomenon
Basic Standard Test Value
Performance Criteria
Conducted RF
IEC 61000-4-6
3V(150Khz to 80Mhz)
Meets Criterion A
Burst
IEC 61000-4-4
2kV (5/50ns, 5kHz) L-N
1kV (5/50ns, 5kHz) L-L
Meets Criterion A
Meets Criterion A
Surge
IEC 61000-4-5
2kV L-E
1KV L-L
Meets Criterion A
Meets Criterion A (Note 1)
Voltage Dips
IEC 61000-4-11
0% during 1 cycle
40% during 10/12 cycles
70% during 25/30 cycles
Meets Criterion A
Meets Criterion A
Meets Criterion A
Short Interruptions
IEC 61000-4-11
0% during 250/300 cycles
Meets Criterion A (Note 1)