Dalsa C1240, User Manual

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Nano Series GigE Vision Camera Genie Nano Specifications • 13
Sensor Cosmetic Specifications
After Factory Calibration and/or Corrections are Applied (if applicable — dependent on sensor)
Blemish Specifications Maximum Number of
Defects
Blemish Description
Hot/Dead Pixel defects
Typical 0.0025%
Max 0.005%
Any pixel that deviates by ±20% from the average of
neighboring pixels at 50% saturation including pixel stuck at 0
and maximum saturated value.
Spot defects none Grouping of more than 8 pixel defects within a sub-area of 3x3
pixels, to a maximum spot size of 7x7 pixels.
Clusters defects none Grouping of more than 5 single pixel defects in a 3x3 kernel.
Column defects none Vertical grouping of more than 10 contiguous pixel defects
along a single column.
Row defects none Horizontal grouping of more than 10 contiguous pixel defects
along a single row.
•
Test conditions
•
Nominal light = illumination at 50% of saturation
• Temperature of camera is 45°C
•
At exposures lower than 0.1 seconds
•
At nominal sensor gain (1x)
•
For Model C4900 (Rolling Shutter sensor) see Model C4900 Sensor Cosmetic Specifications
•
On-Semi Python Sensor Limitations:
•
Guarantied pixel saturation: from a minimum exposure to 100 millisecond (Gain1.0)
for the 0.3M to 5M models
•
Guarantied pixel saturation: from a minimum exposure to 10 millisecond (Gain1.0)
for the 16M to 25M models
• Sony Sensor Limitation:
•
Max pixel saturated values: Max Pixel format bit depth – 1DN (either 10-bit or 12-bit, as
designed by Sony)
Dynamic Range & Signal to Noise Ratio Measurement Conditions
Specifications calculated according to EMVA-1288 standard, using white LED light
Dynamic Range Test Conditions
•
Exposure 100µs
• 0% Full Light Level
SNR Test Conditions
• Exposure 2000µs
• 80% saturation