BCM570x • Diagnostic User’s Guide
page iii
Broadcom Confidential and Proprietary
TABLE OF CONTENTS
1
INTRODUCTION ............................................................................................................................... 1
2
PREREQUISITES............................................................................................................................... 2
3
DIAGNOSTIC TESTS ........................................................................................................................ 3
3.1
T
EST
N
AMES
.................................................................................................................................. 3
3.2
E
RROR
C
ODES
................................................................................................................................ 4
3.3
T
EST
D
ESCRIPTIONS
....................................................................................................................... 4
3.3.1
A1. Indirect Register Test ......................................................................................................... 4
3.3.2
A2. Control Register Test ......................................................................................................... 4
3.3.3
A3. Interrupt Test...................................................................................................................... 4
3.3.4
A4. BIST.................................................................................................................................... 4
3.3.5
A5. PCI Cfg Register Test......................................................................................................... 4
3.3.6
A6. Serial Number Reg Test ..................................................................................................... 5
3.3.7
A7. Power Register Test ........................................................................................................... 5
3.3.8
B1. Scratch Pad Test ................................................................................................................ 5
3.3.9
B2. BD SRAM Test ................................................................................................................... 6
3.3.10
B3. DMA SRAM Test............................................................................................................ 6
3.3.11
B4. MBUF SRAM Test ......................................................................................................... 6
3.3.12
B5. MBUF SRAM via DMA Test.......................................................................................... 6
3.3.13
B6. External SRAM Test....................................................................................................... 7
3.3.14
B7. CPU GPR Test............................................................................................................... 7
3.3.15
C1. EEPROM Test ............................................................................................................... 7
3.3.16
C2. CPU Test ....................................................................................................................... 7
3.3.17
C3. DMA Test....................................................................................................................... 7
3.3.18
C4. MII Test ......................................................................................................................... 8
3.3.19
C5. VPD Test........................................................................................................................ 8
3.3.20
C6. ASF Test ........................................................................................................................ 9
3.3.21
C7. ROM Expansion Test ..................................................................................................... 9
3.3.22
C8. CPU Fetch Test ............................................................................................................. 9
3.3.23
D1. Mac Loopback Test ....................................................................................................... 9
3.3.24
D2. Phy Loopback Test ...................................................................................................... 10
3.3.25
D3. RJ45 Loopback Test .................................................................................................... 10
3.3.26
D4. 1G False Carrier Test ................................................................................................. 10
3.3.27
D5. MII Miscellaneous Test ............................................................................................... 11
3.3.28
D6. MSI Test ...................................................................................................................... 11
3.3.29
E1. 1G Wire Open/Short (** ZERO LEN LB RJ45 **) Test .............................................. 11
4
COMMAND LINE OPTION PARAMETERS............................................................................... 12
5
RECOVER DEVICE FROM CORRUPT NVAM ......................................................................... 26
6
EEPROM.TXT FORMAT................................................................................................................ 27
7
USER INTERFACE COMMANDS................................................................................................. 32
8
SPECIAL INSTRUCTION............................................................................................................... 37
9
SAME SYSTEM SEND/RESPOND TEST ..................................................................................... 38
9.1
I
DENTIFYING A REFERENCE DEVICE
.............................................................................................. 38