Broadcom NetXtreme Ethernet Adapter • Diagnostic User’s Guide
page 5
Broadcom Confidential and Proprietary
Default:
Enabled
3.3.6 A6. Serial Number Reg Test
Command:
serial
Function:
Tests the PCI-E Serial Number capabilities registers on chips that support the
Serial Number capability. This command is supported on 5751Cx, 5755, 5787.
Default:
Enabled.
3.3.7 A7. Power Register Test
Command:
power
Function:
Tests the PCI-E Power capabilities registers on chips that support the Power
capability. This command is supported on 5751Cx, 5755, 5787.
Default:
Enabled.
3.3.8 B1. Scratch Pad Test
Command:
memtest -s
Function:
This test tests the scratch pad SRAM on board. The following tests are
performed:
Data Pattern Test:
Write test data into SRAM, read back to ensure data is correct. The test
data used is 0x00000000, 0xffffffff, 0xaa55aa55, and 0x55aa55aa.
Alternate Data Pattern Test:
Write test data into SRAM. Write complement test data into
next address. Read back both data to insure the data is correct. After the test, the program
reads back data one more time to insure the data stays correct. The test data used is
0x00000000, 0xffffffff, 0xaa55aa55, and 0x55aa55aa.
Address Test:
Write each address with unique increment data. Read back data to insure
data is correct. After fill the entire data with the unique data, the program reads back data
again to insure data stays the same.
WalkingOne bit Test:
For each address. Data one is written and read back for testing.
Then shift the data left one bit, so the data becomes two and do the same test again. It
repeats for 32 times until the test bit is shifted out of test data. The same is test is repeated
for entire test range.
Pseudo Random Data Test:
A pre-calculated pseudo random data is used to write a
unique data into each test RAM. After the first pass the test, the program reads back one
more time to insure data stays correct.
