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Installation and User’s Guide
1
Introducing the Agilent 85225F Performance Modeling System
The 1/f Noise Subsystem
The Agilent 35670A dynamic signal analyzer (in conjunction with a
customer- furnished Stanford Model SR570 low noise amplifier) measures
the flicker noise (1/f noise) of active devices. Controlled by IC- CAP device
modeling software, the dynamic signal analyzer generates reliable 1/f noise
measurement data, which are analyzed and extracted in IC- CAP.
Figure 17
shows the system configuration for 1/f noise measurements.
Figure 16
System Block Diagram
Summary of Contents for 85225F
Page 1: ...Agilent Technologies Agilent 85225F PerformanceModelingSystem Installation and User s Guide ...
Page 90: ...90 Installation and User s Guide 2 Installing the System ...
Page 102: ...102 Installation and User s Guide 3 Verifying System Functionality ...
Page 110: ...110 Installation and User s Guide 4 Servicing the System ...
Page 118: ...118 Installation and User s Guide A Enhancing Measurement Accuracy ...
Page 128: ...128 Installation and User s Guide C RF Subsystem Functional Verification Test ...