Agilent Technologies 16451B, Operation Manual

Page: 95 / 149

Non-Contacting
Electrode Method
F or the Non-Contacting method, the 16451B can perform an Air
Gap method. The 16451B provides two sizes of electrodes for the
Air Gap method, so you should select the electrode for the material
to be tested. F or more information on selecting electrodes , refer to
\Measurement Method". Figure 3-32 shows a simple model of the
Non-Contacting method.
Figure 3-32. Non-Contacting Electrode Method (Air Gap Method)
Procedure
1. Prepare the test material so that the 16451B can measure it. (F or
more information, refer to \Preparation of T est Material".)
2. Connect the 16451B to the instrument.(F or more information,
refer to \Connecting to the Instrument".)
3. Set up the instrument to measure capacitance (C
s
-D).
4. Change to the electrode you will use and perform the Rough
A djustment. (Refer to \Changing the Guarded/Guard Electrode ".)
5. P erform an OPEN/SHORT correction
6. A djust the electrodes to be parallel using the A ccurate
A djustment. (Refer to \Electrode A djustment".)
7. Set the test material between the electrodes .
8. A djust the small knob of the micrometer to set the gap between
Guarded/Guard electrode and Unguarded electrode to t
g
so that
the gap distance between the Guarded/Guard electrode and the
test material is less than 10 % of thickness of the test material.
9. Measure capacitance (C
s2
) and dissipation factor (D
2
)
10. Carefully remove the test material.
11. Measure capacitance (C
s1
) and dissipation factor (D
1
) and then
calculate the dielectric constant ( ) and dissipation factor (D
t
)
using the following equations .
Operation 3-49