Agilent Technologies 16451B, Operation Manual

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Typical
Measurement
Procedure by the
Measurement
Methods
The 16451B can be used for three measurement methods , Contacting
Electrode method (Rigid Metal electrode), Contacting Electrode
method (Thin Film electrode) and Non-Contacting Electrode method
(Air Gap method), to obtain the dielectric constant and dissipation
factor . This section provides typical measurement procedure for each
measurement method. (F or information about how to select the
measurement method, refer to \Measurement Method".)
Caution
DO NOT use the large knob to bring the Guarded/Guard electrode into
contact with the Unguarded electrode or test material, doing so will
damage the micrometer or the surface of the electrodes . Y ou must use
the small knob when you bring an electrode into contact with another
electrode or test material. It has a built in clutch which will slip at a
specied torque .
Note
Y ou should perform the adjustment in the same environmental
conditions as you will measure the test material using the 16451B ,
because a change of temperature causes mechanical dimensions to
change . When you change temperature condition, you should perform
the accurate adjustment after temperature conditions have changed,
because a change of temperature causes mechanical dimensions to
change .
Contacting Electrode
Method
F or the Contacting Electrode method, the 16451B provides two types
of electrodes , Rigid Metal electrodes (Electrode-A and Electrode-B)
and Electrode for Thin Film electrodes(Electrode-C and Electrode-D),
and provides two diameters for each type , so you should select the
electrodes . F or more information on selecting electrode , refer to
\Contacting Electrode Method (used with Rigid Metal Electrode)"
and \Contacting Electrode Method (used with Thin Film Electrode )".
Figure 3-30 shows the model of Contacting Electrode (Rigid Metal
electrode) and Figure 3-31 shows the model of Contacting electrode
(Thin Film electrode).
Operation 3-45