V
OLTECH
AC
I
NTERFACE
U
SER
M
ANUAL
98-072
ISS
7
PAGE
34
3.6. I
NTEGRATION OF
AC
I
NTERFACE TESTS WITH
IR,
HPDC,
HPAC,
DCRT,
ACRT,
DCVB,
ACVB
T
ESTS
This applies when writing test programs combining the AC Interface “X” tests with any of the following
standard AT tests; IR, HPDC, HPAC, DCRT, ACRT, DCVB, ACVB Tests (High Voltage Tests)
IMPORTANT: Voltech AT5600 / AT3600 programs that include any of these tests should be written such that
the AC Interface output (and connected winding) is only ever used as the LO terminal on any HI POT test,
The AC interface should NEVER be connected to a node that is also used by a test, in the same program, as
a HI terminal for a HI POT test.
This is so that the AC Interface unit is always kept at low potential with respect to Earth.
The following illustrates this principle the fixture and wiring has been constructed so that the HI and LO
connections from the AC Interface are hard wired to Nodes 3 & 4, which are then used as LO in the following
HPAC test.
Newer versions of the AT EDITOR will detect violations to this rule and warn you. In most cases, simply
reversing the HI LO nodes on the HPAC HPDC tests will resolve this conflict.
As the choice of HI / LO for HIPOT testing is largely arbitrary it will not affect the low current measurement
made during a HIPOT test
