Vatech A9, Руководство пользователя, Страница: 78 / 196

8. Acquiring CEPH Images (Optional)
78 vatech A9 (Model name: PHT-30CSS) User Manual

Examination Programs
It is classified as below based on the ROI (Region of Interest).
Examination
Area
Description Position
Lateral/
Full Lateral
(Optional)

Used to study craniofacial disease,
trauma, and congenital malformation and
examine the soft tissue in the
otorhinolaryngological area, the sinus,
and the hard palate.

Measures the angles formed by the
connecting lines between the cranial
measurement points to further assess the
growth of the facial region. It's widely
used in Orthodontics and Oral and
Maxillofacial Surgery.
<Lateral>
<Full Lateral>
PA

The radiation is directed from the
posterior of the skull to the anterior.

It is used to examine cranial diseases,
trauma, and congenital malformations.

It is used to assess the growth of the
lateral side of the face. It is also used to
examine the ramus mandibulae, the
posterior region of the third-largest molar
in the lower jaw, the sidewall of the
maxillary sinus, the frontal sinus, antrum
ethmoidal, olfactory pits, and optic disc
pits.

Measures the angles formed by the
connecting lines between the cranial
measurement points to further assess the
growth of the facial region. It is widely
used in Orthodontics and Oral and
Maxillofacial Surgery.
<PA>
SMV

Used to study the base of the skull,
horizontal angulation of the mandibular
condylar axis, the sphenoid sinus, the
curvature of the lower jaw, the sidewall of
the maxillary sinus, and zygomatic arch
fractures. Also used to study the inner
and outer alar plates and holes at the
base of the skull.
<SMV>