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SU640CSX
4110-0462, Rev. B
Page 79 of 97
© 2016 UTC Aerospace Systems
Date Printed: 1-Dec-2016
This document does not contain any export controlled technical data.
Setting Type
Global
Command BIN:ENABLE
state
Parameters
state
Return Values
value
Range
ON
Enables Binning Mode
OFF
Disables Binning Mode
Type string
Example BIN:ENABLE
ON
5.17.2.
Get Binning Mode State
Description
Gets the state of Binning Mode.
Setting Type
Global
Command BIN:ENABLE?
Parameters none
Return Values
value
Range
ON
Binning Mode Enabled
OFF
Binning Mode Disabled
Type string
Example
BIN:ENABLE? -- query command
ON -- return value
5.18.
Test Commands
The Test Pattern mode can be used to verify the integrity of the data collection. When this mode is
enabled, the camera returns one of four image patterns with predictable values. The timing of the data
presenting on the Camera Link interface remains unchanged from when active pixel data is returned. The
test pattern data is returned for all pixels. The Test Pattern conforms to the current Window size. See
Section 5.20 Windowing Commands. The test pattern data is only transmitted over the interface as
described if the Digital Signal Source is set to PAT. (See Digital Source command.)
5.18.1.
Set Test Pattern State
Description
Sets the test pattern state. When ON, a test pattern is returned in
place of data from the focal plane array. One of four patterns may
be selected.