2. Interface Operation
57
Tsi308 User Manual
80D4000_MA001_02
Tundra Semiconductor Corporation
www.tundra.com
2.11.1.1
Memory BIST Controller
JTAG Memory BIST controller is the interface between JTAG and Memory BIST controllers in
each of the four ports. It also decodes JTAG-MBIST instruction and generates BIST enable for
the four ports. After BIST operation is over is collects the status information from all the four
ports and sends out through JTAG controller.
2.11.1.2
CSR Read/Write Controller
JTAG CSR controller decodes the JTAG-CSR instruction and generates required signals for
JTAG CSR read/write operation. It also returns JTAG CSR read data to the JTAG controller.
2.11.1.3
LDT BIST
LDT BIST controller generates Tri-State, Reset, PowerOK signals if JTAG-RUNBIST
instruction is executed.
2.11.1.4
Boundary Scan
Boundary Scan is a DFT technique for testing chips and inter-connectivity among chips on
printed circuit board. With JTAG insertion to the IC design circuitry, only few signals are
needed to control the test activity of the chip instead of the ad-hoc Bed-of-Nails technique.
Boundary Scan JTAG instruction SAMPLE/PRELOAD access the boundary scan register via a
data scan operation to take a sample of the functional data entering and leaving the device. This
instruction is also used to preload test data into the boundary scan register prior to loading and
EXTEST instruction.
The EXTEST instruction places the device into an external boundary test mode and selects the
boundary scan register to be connected between TDI and TDO. During this instruction, the
boundary scan cells associated with outputs are preloaded with test patterns to test downstream
devices. The input boundary cells are set up to capture the input data for later analysis.
2.11.1.5
Signal setting for BSD
Following are the signal values to be set during BSD test.
TMODE
This signal need to be 1’b0 so that MODE1 and for tristate will be generated based on JTAG
instructions. In the design, these two signals are forced to 1’b0 when TMODE is high (i.e.,
during ATPG).
Power Down
For all pads to be active during Boundary Scan, the power down signals generated inside the
design have been forced to Low.
Содержание TSI308
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