5. Electrical Characteristics
195
Tsi308 User Manual
80D4000_MA001_02
Tundra Semiconductor Corporation
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5.3.2
T
CADV
(TCADValid)
T
CADV
defines the TX_CAD/CTL valid time from TX_CAD/CTL to TX_CLK or from
TX_CLK to TX_CAD/ CTL and is simultaneously an aggregate measurement of the accuracy
of the transmitter to place the TX_CAD/CTL edges relative to TX_CLK edge, the minimum
TX_CLK bit-time and, the TX_CAD/CTL group skew.
Nominally, TX_CLK is driven delayed by one-half of a bit-time from the TX_CAD/CTL
transitions. This delay provides required setup and hold time to and from the TX_CLK edge at
the receiver and therefore allows for simple data recovery. T
CADV_MIN
is measured at the
device pins from the crossing point of either the latest TX_CAD/CTL transition to the crossing
point of the TX_CLK transition or the TX_CLK transition to the earliest TX_CAD/CTL
transition. T
CADV_MAX
is measured at the device pins from either the crossing point of the
earliest TX_CAD/CTL transition to the crossing point of the TX_CLK transition or the
TX_CLK transition to the latest TX_CAD/CTL transition.
Because T
CADV
is an aggregate measure of different uncertainties, it must be measured over a
large number of samples and under conditions defined to maximize TX_CAD/CTL group skew,
TX_CLK edge placement error, and TX_CLK phase compression.
Figure 12: T
CADV
TX_CAD/CTL Group
TX_CLK
T
CADV MIN
T
CADV MAX
Содержание TSI308
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