Toshiba Satellite A100 Series, Руководство по обслуживанию

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3 Diagnostic Programs 3.6 Memory Test
42 Satellite A100/A105 / TECRA A7 Maintenance Manual
Pattern Size: Choose the pattern size – BYTE, WORD, DWORD or ALL.
Percent (%): Choose the percentage of the defined range of the memory to
be tested.
Time Limit(h): Choose or Input the time (hour) of the defined range of the
memory to be tested.
Time Limit(m): Choose or Input the time (minute) of the defined range of
the memory to be tested.
1. Bit Stuck High Test
Data pattern: Every bit is ‘1’ (Each bit is high)
2. Bit Stuck Low Test
Data pattern: Every bit is ‘0'(Each bit is low);
3. Checker Board Test
Data pattern: Lo-byte and hi-byte are composed with 0101(0x5) and 1010
(0xA);
4. CAS Line Test
Data pattern: Lo-byte and hi-byte are composed with 0000 (0x0) and
1111(0xF);
5. Incremental Test
Data pattern: A series of increasing data from 0 by adding 1 each time;
6. Decrement Test
Data Pattern: A series of decreasing data from the maximum (e.g. 0xFFFF) by
subtracting 1 each time;
7. Incremental / Decrement Test
Data Pattern is a series of data whose low byte is increasing data from 0x00
and high byte is decreasing data from 0xFF.
Subtest 04 Extended Pattern
In addition to the above pattern test of the memory, there is Read/Write Cycle test
and Read Cycle Test for the extended memory.
Below is the parameter dialog window of the extended pattern test.