Slew Scan Mode
31
DLPU016C – April 2014 – Revised April 2019
Copyright © 2014–2019, Texas Instruments Incorporated
Operating the DLP NIRscan EVM
Figure 3-9. Eample Slew Scan
The graphical representation in
shows the absorbance spectrum of the sampled material, with
absorbance units (AU) on the y-axis and wavelength on the x-axis. The 3 regions of interest are
highlighted in blue and the two regions not of interest are identified with the word "unscanned". Each
scanned region is measured based on the configuration information supplied for that region. For
unscanned spectral regions not configured in the configuration table, the graphical output shows a straight
line from the last wavelength in region N to the first wavelength in region N+1.
1. To run another scan, insert the new sample and select the
Run New Scan
button. The new scan runs,
the new absorbance spectrum calculates (using the previous reference), and the new spectrum plots
all with one button click. This action can be performed repeatedly. The scan filename provided on the
previous Slew Scan configuration screen increments with each sample run. Data files for these scans
can then be downloaded to a local machine.
2. To save the spectrum data for the most recent scan to a local machine, click the
Download Spectrum
Data
button. This action prompts the user to open the .csv file in excel (if available on the users
machine) or to save the file locally. The file format provided for Slew Scan mode is very similar to the
previously defined Custom Scan file format, except that the system identifies the file format as a Slew
Scan and breaks in the wavelength data occur for undefined scan regions.
